kernel_samsung_a53x/tools
Yonghong Song d55932ee41 selftests/bpf: Fix flaky test btf_map_in_map/lookup_update
[ Upstream commit 14bb1e8c8d4ad5d9d2febb7d19c70a3cf536e1e5 ]

Recently, I frequently hit the following test failure:

  [root@arch-fb-vm1 bpf]# ./test_progs -n 33/1
  test_lookup_update:PASS:skel_open 0 nsec
  [...]
  test_lookup_update:PASS:sync_rcu 0 nsec
  test_lookup_update:FAIL:map1_leak inner_map1 leaked!
  #33/1    btf_map_in_map/lookup_update:FAIL
  #33      btf_map_in_map:FAIL

In the test, after map is closed and then after two rcu grace periods,
it is assumed that map_id is not available to user space.

But the above assumption cannot be guaranteed. After zero or one
or two rcu grace periods in different siturations, the actual
freeing-map-work is put into a workqueue. Later on, when the work
is dequeued, the map will be actually freed.
See bpf_map_put() in kernel/bpf/syscall.c.

By using workqueue, there is no ganrantee that map will be actually
freed after a couple of rcu grace periods. This patch removed
such map leak detection and then the test can pass consistently.

Signed-off-by: Yonghong Song <yonghong.song@linux.dev>
Signed-off-by: Daniel Borkmann <daniel@iogearbox.net>
Link: https://lore.kernel.org/bpf/20240322061353.632136-1-yonghong.song@linux.dev
Signed-off-by: Sasha Levin <sashal@kernel.org>
2024-11-19 14:19:06 +01:00
..
accounting Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
arch x86/insn: Fix PUSH instruction in x86 instruction decoder opcode map 2024-11-19 12:26:59 +01:00
bootconfig Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
bpf bpf: Fix potential integer overflow in resolve_btfids 2024-11-19 12:27:10 +01:00
build Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
cgroup Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
crypto Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
debugging Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
edid Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
firewire Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
firmware Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
gpio Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
hv Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
iio tools: iio: replace seekdir() in iio_generic_buffer 2024-11-19 09:23:15 +01:00
include hugetlb_encode.h: fix undefined behaviour (34 << 26) 2024-11-19 14:19:05 +01:00
io_uring Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
kvm/kvm_stat Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
laptop Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
leds Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
lib libsubcmd: Fix parse-options memory leak 2024-11-19 12:27:05 +01:00
memory-model Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
objtool exit: Rename module_put_and_exit to module_put_and_kthread_exit 2024-11-19 12:27:50 +01:00
pci Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
pcmcia Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
perf perf stat: Avoid metric-only segv 2024-11-19 08:44:53 +01:00
power tools/power turbostat: Fix Bzy_MHz documentation typo 2024-11-19 11:32:44 +01:00
scripts Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
spi Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
testing selftests/bpf: Fix flaky test btf_map_in_map/lookup_update 2024-11-19 14:19:06 +01:00
thermal/tmon Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
time Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
usb Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
virtio Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
vm Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
wmi Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00
Makefile Import A536BXXU9EXDC 2024-06-15 16:02:09 -03:00